Published March 1, 1993
| Version v1
Journal article
The study of the possibility to use CAMEX chips in collider experiments with short bunch crossing time
- 1. Budker Inst. for Nuclear Physics, Novosibirsk (Russia)
Description
The study of the possibility to use CAMEX chips in several systems of the detector KEDR at the e+e- collider VEPP-4M was performed. The relatively short bunch crossing time at VEPP-4M 60 ns leads to some problems with the use of CAMEX in the standard mode. The different ways to overcome these difficulties are investigated and compared. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A
- Journal Volume
- 326
- Journal Issue
- 1/2
- Journal Page Range
- p. 120-125.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- New developments on radiation detectors.
- Acronym
- 6. European symposium on semiconductor detectors
- Dates
- 24-26 Feb 1992.
- Place
- Milan (Italy).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24036209
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; BACKGROUND NOISE; BEAM BUNCHING; COLLIDING BEAMS; DEAD TIME; ELECTRON BEAMS; INTEGRATED CIRCUITS; LOGIC CIRCUITS; POSITION SENSITIVE DETECTORS; POSITRON BEAMS; PREAMPLIFIERS; PULSE AMPLIFIERS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; TRIGGER CIRCUITS; VEPP-4
- Descriptors DEC
- AMPLIFIERS; BEAM DYNAMICS; BEAMS; DYNAMICS; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; NOISE; PARTICLE BEAMS; PULSE CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; TIMING PROPERTIES