Monochromatic wavelength dispersive x-ray fluorescence providing sensitive and selective detection of uranium
Creators
- 1. Los Alamos National Laboratory, Los Alamos, NM (United States)
- 2. XOS, East Greenbush, NY (United States)
Description
Monochromatic wavelength dispersive X-ray fluorescence (MWDXRF) is a sensitive and selective method for elemental compositional analyses. The basis for this instrumental advance is the doubly curved crystal (DCC) optic. Previous work has demonstrated the feasibility of sensitive trace element detection for yttrium as a surrogate for curium in aqueous solutions. Additional measurements have demonstrated similar sensitivity in several different matrix environments which attests to the selectivity of the DCC optic as well as the capabilities of the MWDXRF concept. The objective of this effort is to develop an improved Pu characterization method for nuclear fuel reprocessing plants. The MWDXRF prototype instrument is the second step in a multi-year effort to achieve an improved Pu assay. This work will describe a prototype MWDXRF instrument designed for uranium detection and characterization. The prototype consists of an X-ray tube with a rhodium anode and a DCC excitation optic incorporated into the source. The DCC optic passes the RhKα line at 20.214 keV for monochromatic excitation of the sample. The source is capable of 50 W power at 50 kV and 1.0 mA operation. The x-ray emission from the sample is collected by a DCC optic set at the ULα line of 13.613 keV. The collection optic transmits the ULα x-rays to the silicon drift detector. The x-ray source, sample, collection optic and detector are all mounted on motion controlled stages for the critical alignment of these components. The sensitivity and selectivity of the instrument is obtained through the monochromatic excitation and the monochromatic detection. The prototype instrument performance has a demonstrated for sensitivity for uranium detection of around 2 ppm at the current state of development. Further improvement in sensitivity is expected with more detailed alignment.
Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 8 p.
- Report number
- LA-UR--10-04458
Conference
- Title
- 51. Annual Meeting of the Institute of Nuclear Materials Management (INMM)
- Dates
- 11-15 Jul 2010
- Place
- Baltimore, MD (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 42109917
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S11: NUCLEAR FUEL CYCLE AND FUEL MATERIALS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ANODES; AQUEOUS SOLUTIONS; CURIUM; DETECTION; FLUORESCENCE; REPROCESSING; RHODIUM; SENSITIVITY; SILICON; TRACE AMOUNTS; URANIUM; WAVELENGTHS; X-RAY FLUORESCENCE ANALYSIS; YTTRIUM
- Descriptors DEC
- ACTINIDES; CHEMICAL ANALYSIS; DISPERSIONS; ELECTRODES; ELEMENTS; EMISSION; HOMOGENEOUS MIXTURES; LUMINESCENCE; METALS; MIXTURES; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; PLATINUM METALS; REFRACTORY METALS; SEMIMETALS; SEPARATION PROCESSES; SOLUTIONS; TRANSITION ELEMENTS; TRANSPLUTONIUM ELEMENTS; TRANSURANIUM ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Contract/Grant/Project number
- AC52-06NA25396
- Funding organization
- US Department of Energy (United States)
- Secondary number(s)
- LA-UR--10-4458