Published May 1974
| Version v1
Journal article
Secondary electron yield with primary electron beam of kilo-electron-volts
Description
Secondary electron yields δPE due to primary electrons of kilo-electron-volts are estimated for various metals by measuring total electron yields δT in an UHV system and using a Monte Carlo calculation to derive δPE from δT. The dependences of δT/δPE as well as δPE on both the atomic number Z and primary energy are also discussed from a theoretical viewpoint based on the Monte Carlo technique for primary energies higher than a few keV and on a simple theory for lower primary energies.
Additional details
Additional titles
- Augmented title (English)
- Scanning electron microscope, image of surface topography
Identifiers
- DOI
- 10.1063/1.1663552;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 45
- Journal Issue
- 5
- Series
- J. Appl. Phys.
- Journal Page Range
- 2107-2111
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 5142253
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ALUMINIUM; BACKSCATTERING; BERYLLIUM; COLLISIONS; COPPER; ELECTRON COLLISIONS; ELECTRON EMISSION; ELECTRON MICROSCOPES; ELECTRONS; GOLD; KEV RANGE; MONTE CARLO METHOD; SECONDARY EMISSION; SILVER; ULTRAHIGH VACUUM
- Descriptors DEC
- ALKALINE EARTH METALS; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; ENERGY RANGE; FERMIONS; LEPTONS; METALS; MICROSCOPES; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent