Published January 1, 1994
| Version v1
Journal article
A time-of-flight detector based on silicon avalanche diodes
Creators
- 1. Dept. of Physics, Purdue Univ., West Lafayette, IN (United States)
- 2. Dept. of Chemistry, Purdue Univ., West Lafayette, IN (United States)
- 3. Nuclear Sci. Div., Lawrence Berkeley Lab., CA (United States)
- 4. Optoelectronics Div., EG and G Canada, Vaudreuil, PQ (Canada)
Description
We have investigated reach-through silicon avalanche diodes (AVDs) as time of flight detectors for nuclear and particle physics experiments. The signal is initiated by a minimum ionizing charged particle passing directly through the AVD. We have studied the effect of pulse amplitude and noise characteristics on timing using β- particles. The time resolution of four AVDs has been measured with a range of standard deviations, σ = 65-87 ps. This time resolution is comparable to the best available with the conventional alternative, a plastic scintillator and photomultiplier tube. Further optimization of the AVD results appears possible. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 337
- Journal Issue
- 2-3
- Journal Page Range
- p. 362-369.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 25037290
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKGROUND NOISE; BETA DETECTION; BREAKDOWN; COINCIDENCE CIRCUITS; OPTIMIZATION; PULSES; SI SEMICONDUCTOR DETECTORS; SILICON DIODES; TIME DEPENDENCE; TIME RESOLUTION; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; NOISE; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TIMING PROPERTIES