Study of structural and surface morphological properties of Tb doped ZnO nanoparticles using XRD, XPS and fractal analysis
Creators
- 1. Department of Physics and Electronics, Dr Ram Manohar Lohia Avadh University, Faizabad-224 001 (India)
- 2. Department of Science and Humanities, K. J. Somaiya College of Engineering, Mumbai-400077 (India)
- 3. Department of Physics, University of Allahabad, Allahabad-211002 (India)
- 4. Department of Physics, Government PG College, Saidabad- 221508 (India)
- 5. Department of Physics, C.M.P. Degree College, University of Allahabad, Allahabad-211002 (India)
- 6. Department of Physics, Ewing Christian College, University of Allahabad, Allahabad-211 003 (India)
- 7. Surface Physics and Materials Science Division, Saha Institute of Nuclear Physics, Kolkata-700064 (India)
Description
A systematic study was performed on Tb3+ doped ZnO nanoparticles of different mole-fraction using Atomic Force Microscopy (AFM), X-ray Diffraction (XRD) and X-ray Photoemission Spectroscopy (XPS) measurements. XRD studies confirm that all the samples are in wurtzite phase. XRD analysis suggests a compressive lattice strain as doping concentration increases. The strain generated in the doped samples is found to be more as compared to pure nanoparticle samples. XPS result indicates the presence of several oxygen species adsorbed on the surface. Furthermore, the effect of incorporation of Tb3+ ions into ZnO nanoparticles was explored using fractal analysis approach to extract the quantitative surface parameters. The fractal dimension is a scale invariant technique for representation and understanding of surface morphology of nanostructures. Fractal dimension provides a clear distinction between vertical and horizontal properties of the surfaces and their correlation. This technique could be very useful in selecting the suitable substrate for various technological applications. The lateral correlation length was estimated by auto-correlation function. While, the roughness exponent and fractal dimension were calculated from height-height correlation function. Moreover, this study reveals that the complexity of surface increases with doping. Moreover, as doping increases, the surface becomes more and more zagged as compared to pure samples. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/ab445fAdditional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 6
- Journal Issue
- 11
- Journal Page Range
- [10 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52012755
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CORRELATION FUNCTIONS; DOPED MATERIALS; FRACTALS; HEIGHT; MORPHOLOGY; NANOPARTICLES; TERBIUM IONS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTRON SPECTROSCOPY; FUNCTIONS; IONS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PARTICLES; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY; ZINC COMPOUNDS