Published October 2006
| Version v1
Journal article
Room design for high-performance electron microscopy
Creators
- 1. School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 (United States) and Cornell Center for Materials Research, Cornell University, Ithaca, NY 14853 (United States)
- 2. School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 (United States)
- 3. Cornell Center for Materials Research, Cornell University, Ithaca, NY 14853 (United States)
Description
Aberration correctors correct aberrations, not instabilities. Rather, as spatial resolution improves, a microscope's sensitivity to room environment becomes more noticeable, not less. Room design is now an essential part of the microscope installation process. Previously ignorable annoyances like computer fans, desk lamps and that chiller in the service corridor now may become the limiting factors in the microscopes performance. We discuss methods to quantitatively characterize the instrument's response to magnetic, mechanical, acoustical and thermal disturbances and thus predict the limits that the environment places on imaging and spectroscopy
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2006.04.017;
- PII
- S0304-3991(06)00103-3;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 106
- Journal Issue
- 11-12
- Journal Page Range
- p. 1033-1040
- ISSN
- 0304-3991
- CODEN
- ULTRD6
Conference
- Title
- International workshop on enhanced data generated by electrons
- Dates
- 1-5 May 2005
- Place
- Grundlsee (Austria)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38022983
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BLOWERS; COMPUTERS; DESIGN; ELECTRON MICROSCOPY; LIGHT BULBS; MICROSCOPES; PERFORMANCE; SENSITIVITY; SPATIAL RESOLUTION; SPECTROSCOPY
- Descriptors DEC
- MICROSCOPY; RESOLUTION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.