Published December 2013
| Version v1
Journal article
Development of multiple total reflection X-ray fluorescence spectrometer
- 1. Nuclear and Radiation Safety Center, Beijing (China)
- 2. China Institute of Atomic Energy, Beijing (China)
Description
A high sensitive multiple total reflection X-ray fluorescence spectrometer was developed, the design, components and debugging of optics system and spectrum analysis system are focused on in this article, in addition, the results of performance tests are analyzed. The results show that the MDL of instrument can reach 0.1 ng and the RSD (n = 6) is 5%∼16%. The TXRF has been applied to analysis the airborne particulate matter around certain nuclear facilities, the result was satisfactory. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 33
- Journal Issue
- 12
- Journal Page Range
- p. 1494-1497, 1542
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 49064791
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- DESIGN; FLUORESCENCE; NUCLEAR FACILITIES; OPTICS; PARTICULATES; PERFORMANCE; REFLECTION; SPECTRA; SPECTROMETERS; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; MEASURING INSTRUMENTS; PARTICLES; PHOTON EMISSION; RADIATIONS
Optional Information
- Notes
- 4 figs., 4 tabs., 14 refs.