Published February 2021 | Version v1
Journal article

Synthesis and electronic properties of InSe bi-layer on Si(111)

  • 1. Institute of Automation and Control Processes, Radio 5, Vladivostok 690041 (Russian Federation)
  • 2. School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 (Russian Federation)
  • 3. Institute of Strength Physics and Materials Science, Tomsk 634055 (Russian Federation)

Description

Highlights: • InSe forms bi-layer structure on the initial deposition stage on Si(111) surface. • Strong interaction of InSe bi-layer with the substrate leads to charge transfer. • Mexican-hat shape of the valence band is eliminated due to charge transfer. In this paper, we report on the transient phase that forms at the initial stages of InSe growth on Si(111) surface. Using scanning tunneling microscopy and angle resolved photoemission spectroscopy observation and density-functional-theory (DFT) calculations we found that it consists of In-Se bi-layer that is half of the authentic InSe quadruple layer (QL). It has indirect band gap of ~1.2 eV and the parabolic shape of the valence band in contrast to the Mexican-hat shape of the valence band observed for InSe QL. Parity analysis of the valence bands suggests inversion of the Se pz and px,y orbitals near the Γ¯ point. We attribute the observed features of the InSe valence bands to the charge transfer from the InSe bi-layer to the Si(111) substrate.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2020.148144

Additional details

Identifiers

DOI
10.1016/j.apsusc.2020.148144;
PII
S0169433220329019;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
539
Journal Page Range
vp.
ISSN
0169-4332
CODEN
ASUSEE

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Copyright
Copyright (c) 2020 Elsevier B.V. All rights reserved.