Photothermal molecular sensing by using metal thin-film nanograting for chemical and biomedical applications
- 1. Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125 (United States)
- 2. Wei and Associates, 3715 Malibu Vista Dr, Malibu, CA 90265 (United States)
Description
We have developed a highly sensitive molecular sensor based on the heterodyne-detected third order nonlinear optical measurement with metal thin-film gratings. Pumped by an ultra-violet laser, the stripe pattern of the grating is transferred to the sample solution. The properties of the solution are detected via probe beam diffraction output from this special modulation. Time dependent signals profiles in nitrobenzene/2-propanol solution are thus obtained. The signal intensities as well as the concentrations of solute are proportional to the induced third order nonlinear electric susceptibility of solution. This technique can even detect the properties of those molecules and chemical compounds which are colorless and non-fluorescent. The merits of this method, such as simplicity, the high sensitivity, and the high speed, should be suitable for the molecular sensor of the microfluidic devices
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2004.06.173;
- PII
- S0040-6090(04)00990-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 469-470
- Journal Issue
- 1-2
- Journal Page Range
- p. 420-424
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 31. international conference on metallurgical coatings and thin films
- Dates
- 19-23 Apr 2004
- Place
- San Diego, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36091672
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIFFRACTION; METALS; SOLUTIONS; THIN FILMS; TIME DEPENDENCE
- Descriptors DEC
- COHERENT SCATTERING; DISPERSIONS; ELEMENTS; FILMS; HOMOGENEOUS MIXTURES; MIXTURES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.