Published December 22, 2004 | Version v1
Journal article

Photothermal molecular sensing by using metal thin-film nanograting for chemical and biomedical applications

  • 1. Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125 (United States)
  • 2. Wei and Associates, 3715 Malibu Vista Dr, Malibu, CA 90265 (United States)

Description

We have developed a highly sensitive molecular sensor based on the heterodyne-detected third order nonlinear optical measurement with metal thin-film gratings. Pumped by an ultra-violet laser, the stripe pattern of the grating is transferred to the sample solution. The properties of the solution are detected via probe beam diffraction output from this special modulation. Time dependent signals profiles in nitrobenzene/2-propanol solution are thus obtained. The signal intensities as well as the concentrations of solute are proportional to the induced third order nonlinear electric susceptibility of solution. This technique can even detect the properties of those molecules and chemical compounds which are colorless and non-fluorescent. The merits of this method, such as simplicity, the high sensitivity, and the high speed, should be suitable for the molecular sensor of the microfluidic devices

Additional details

Identifiers

DOI
10.1016/j.tsf.2004.06.173;
PII
S0040-6090(04)00990-3;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
469-470
Journal Issue
1-2
Journal Page Range
p. 420-424
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
31. international conference on metallurgical coatings and thin films
Dates
19-23 Apr 2004
Place
San Diego, CA (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36091672
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIFFRACTION; METALS; SOLUTIONS; THIN FILMS; TIME DEPENDENCE
Descriptors DEC
COHERENT SCATTERING; DISPERSIONS; ELEMENTS; FILMS; HOMOGENEOUS MIXTURES; MIXTURES; SCATTERING

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.