An experimentally consistent atomistic structural model of silica glass
Creators
- 1. ISIS Facility, Rutherford Appleton Laboratory, Chilton, Didcot OX11 0QX (United Kingdom)
Description
Empirical potential structure refinement is used to build an atomistic model of silica glass based on neutron scattering data. This model is tested against X-ray diffraction and extended X-ray absorption fine structure (EXAFS) spectroscopy data to establish its local and intermediate range structural veracity. The chemical specificity of the silicon and oxygen K-edge spectroscopic information allows us to confirm that the neutron scattering derived model represents a reasonable representation of the three partial structure factors that are required to characterise this binary glass and subsequently give confidence in the Faber-Ziman and Bhatia-Thornton partial structure factors and pair distribution functions that are extracted from the model
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2007.11.030Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2007.11.030;
- PII
- S0921-5107(07)00669-1;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 149
- Journal Issue
- 2
- Journal Page Range
- p. 166-170
- ISSN
- 0921-5107
- CODEN
- MSBTEK
Conference
- Title
- The binary ion exchange process in materials science and chemistry: application, characterization and modelling
- Acronym
- E-MRS 2007 fall conference symposium F
- Dates
- 17-21 Sep 2007
- Place
- Warsaw (Poland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40036235
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; DISTRIBUTION FUNCTIONS; FINE STRUCTURE; GLASS; NEUTRON DIFFRACTION; SILICA; SILICON; SPECIFICITY; STRUCTURAL MODELS; STRUCTURE FACTORS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELEMENTS; FUNCTIONS; MINERALS; OXIDE MINERALS; SCATTERING; SEMIMETALS; SORPTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.