Published March 25, 2008 | Version v1
Journal article

An experimentally consistent atomistic structural model of silica glass

Creators

  • 1. ISIS Facility, Rutherford Appleton Laboratory, Chilton, Didcot OX11 0QX (United Kingdom)

Description

Empirical potential structure refinement is used to build an atomistic model of silica glass based on neutron scattering data. This model is tested against X-ray diffraction and extended X-ray absorption fine structure (EXAFS) spectroscopy data to establish its local and intermediate range structural veracity. The chemical specificity of the silicon and oxygen K-edge spectroscopic information allows us to confirm that the neutron scattering derived model represents a reasonable representation of the three partial structure factors that are required to characterise this binary glass and subsequently give confidence in the Faber-Ziman and Bhatia-Thornton partial structure factors and pair distribution functions that are extracted from the model

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2007.11.030

Additional details

Identifiers

DOI
10.1016/j.mseb.2007.11.030;
PII
S0921-5107(07)00669-1;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
149
Journal Issue
2
Journal Page Range
p. 166-170
ISSN
0921-5107
CODEN
MSBTEK

Conference

Title
The binary ion exchange process in materials science and chemistry: application, characterization and modelling
Acronym
E-MRS 2007 fall conference symposium F
Dates
17-21 Sep 2007
Place
Warsaw (Poland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40036235
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ABSORPTION SPECTROSCOPY; DISTRIBUTION FUNCTIONS; FINE STRUCTURE; GLASS; NEUTRON DIFFRACTION; SILICA; SILICON; SPECIFICITY; STRUCTURAL MODELS; STRUCTURE FACTORS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELEMENTS; FUNCTIONS; MINERALS; OXIDE MINERALS; SCATTERING; SEMIMETALS; SORPTION; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.