Nonlocal response of grain-boundary-type Josephson junctions to local perturbation
Creators
- 1. Physikalisches Institut, Lehrstuhl Experimentalphysik II, Universitaet Tuebingen, Morgenstelle 14, D-72076 Tuebingen (Germany)
Description
The effect of a focused electron or laser beam on the critical current of Josephson junctions with grain-boundary geometry is analyzed using a numerical iteration method. Beyond a change in the critical current which is proportional to the local critical current density in the irradiated junction region, there is an additional change of the critical current due to a nonlocal modification of the phase difference function. For Josephson junctions larger than the Josephson penetration depth this nonlocal contribution is significant and the total electron beam induced change of the critical current is no longer proportional to the local Josephson current density. Our model calculations are compared to experimental results obtained from the analysis of YBa2Cu3O7-δ grain-boundary Josephson junctions (GBJ's) using low temperature scanning electron microscopy (LTSEM). Comparing the LTSEM measurements to the model calculations gives information on the spatial homogeneity of the critical current density, the influence of the junction geometry on the distribution of the Josephson current density, and the spatial structure of static magnetic flux states
Additional details
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter
- Journal Volume
- 52
- Journal Issue
- 10
- Journal Page Range
- p. 7727-7741.
- ISSN
- 0163-1829
- CODEN
- PRBMDO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27021275
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRITICAL CURRENT; ELECTRON BEAMS; GRAIN BOUNDARIES; HIGH-TC SUPERCONDUCTORS; JOSEPHSON JUNCTIONS; MAGNETIC FLUX; NUMERICAL SOLUTION; PENETRATION DEPTH; RADIATION EFFECTS
- Descriptors DEC
- BEAMS; CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; LEPTON BEAMS; MICROSTRUCTURE; PARTICLE BEAMS; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTORS