Published 2004
| Version v1
Journal article
Study of local strip errors in silicon sensors for the CMS experiment
Creators
- 1. Inst. fuer Experimentelle Kernphysik, Univ. Karlsruhe (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Untersuchung lokaler Streifenfehler bei Siliziumsensoren fuer das CMS Experiment
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 39
- Journal Issue
- 6
- Journal Page Range
- p. 27
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 2004 spring meeting of the German Physical Society, Particle Physics Section
- Original Conference Title
- Fruehjahrstagung 2004 der Deutschen Physikalischen Gesellschaft e.V. (DPG), Fachverband Teilchenphysik (T)
- Dates
- 29 Mar - 1 Apr 2004
- Place
- Mainz (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 35038558
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- DEFECTS; ELECTRIC CONDUCTIVITY; FAILURES; LEAKAGE CURRENT; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS