Manifestations of strain–relaxation in the structure of nano-sized Co-2 × 2 islands grown on Ag/Ge(111)-√3 × √3 surface
Description
We have examined strain–relaxation of Co-2 × 2 islands grown on the Ag/Ge(111)-√3 × √3 surface by analyzing scanning tunneling microscopy images. We have found that the Co-2 × 2 islands commonly adopt a more compact arrangement as compared to that of the Ge(111) substrate, however they differ in a degree of an atomic compactness. We have not found a distinct relation between strain–relaxation and the island height. Three groups of islands have been identified upon analyzing a correspondence between strain–relaxation and the island size: (i) small islands (not bigger than 80 nm2) with a high atomic compactness, displaying fixed inter-row distances, (ii) small islands with unfixed distances between atomic rows, and (iii) big islands (bigger than 80 nm2) with fixed inter-row distances, but with a less compact atomic arrangement compared to that of the first two groups. We propose a model to account for the relation between the relaxation and the island size. - Highlights: ► We examine strain–relaxation of Co-2 × 2 islands grown on Ag/Ge(111)-√3 × √3 surface. ► The Co-2 × 2 islands are more compact as compared to the substrate. ► No relation between the relaxation and the island height. ► Atomic compactness and atomic order as manifestations of strain–relaxation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.03.126Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.03.126;
- PII
- S0040-6090(12)00418-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 16
- Journal Page Range
- p. 5304-5308
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108389
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ISLANDS; NANOSTRUCTURES; RELAXATION; SCANNING TUNNELING MICROSCOPY; STRAINS; SUBSTRATES; SURFACES
- Descriptors DEC
- MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.