Published June 1, 2012 | Version v1
Journal article

Manifestations of strain–relaxation in the structure of nano-sized Co-2 × 2 islands grown on Ag/Ge(111)-√3 × √3 surface

Description

We have examined strain–relaxation of Co-2 × 2 islands grown on the Ag/Ge(111)-√3 × √3 surface by analyzing scanning tunneling microscopy images. We have found that the Co-2 × 2 islands commonly adopt a more compact arrangement as compared to that of the Ge(111) substrate, however they differ in a degree of an atomic compactness. We have not found a distinct relation between strain–relaxation and the island height. Three groups of islands have been identified upon analyzing a correspondence between strain–relaxation and the island size: (i) small islands (not bigger than 80 nm2) with a high atomic compactness, displaying fixed inter-row distances, (ii) small islands with unfixed distances between atomic rows, and (iii) big islands (bigger than 80 nm2) with fixed inter-row distances, but with a less compact atomic arrangement compared to that of the first two groups. We propose a model to account for the relation between the relaxation and the island size. - Highlights: ► We examine strain–relaxation of Co-2 × 2 islands grown on Ag/Ge(111)-√3 × √3 surface. ► The Co-2 × 2 islands are more compact as compared to the substrate. ► No relation between the relaxation and the island height. ► Atomic compactness and atomic order as manifestations of strain–relaxation.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2012.03.126

Additional details

Identifiers

DOI
10.1016/j.tsf.2012.03.126;
PII
S0040-6090(12)00418-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
520
Journal Issue
16
Journal Page Range
p. 5304-5308
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43108389
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ISLANDS; NANOSTRUCTURES; RELAXATION; SCANNING TUNNELING MICROSCOPY; STRAINS; SUBSTRATES; SURFACES
Descriptors DEC
MICROSCOPY

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.