Enhancement of luminescence intensity and increase of emission lifetime in Eu3+-doped 3CdO-Al2O3-3SiO2 amorphous system
- 1. Graduate School of the Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100039 (China)
- 2. Key Laboratory of Excited State Processes, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033 (China)
Description
Intense photoluminescence at room temperature was observed in amorphous cadmium aluminum silicate doped with europium prepared by the sol-gel method. The structure of the 3CdO-Al2O3-3SiO2:Eu3+ system (CAS:Eu3+) has been determined by transmission electron microscopy (TEM) and X-ray diffraction (XRD). The excitation and the emission spectra indicated that the red characteristic emission (611 nm) of CAS:Eu3+ under UV excitation due to 5D0→7F2 electric dipole transition is the strongest. Both XRD data and the emission ratio of (5D0→7F2)/(5D0→7F1) reveal that the Eu3+ is in a site without inversion symmetry. The maximum photoluminescence intensity has been obtained for 25 mol% concentration of Eu3+ in CAS, and the intensity enhancement and lifetime increase of Eu3+ with increasing sintering temperature were observed due to the less OH-content in the samples
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jlumin.2007.05.016Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2007.05.016;
- PII
- S0022-2313(07)00199-8;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 128
- Journal Issue
- 1
- Journal Page Range
- p. 105-109
- ISSN
- 0022-2313
- CODEN
- JLUMA8
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39073240
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ALUMINIUM SILICATES; CADMIUM OXIDES; DOPED MATERIALS; EMISSION SPECTRA; EUROPIUM IONS; EXCITATION; LIFETIME; PHOTOLUMINESCENCE; SILICON OXIDES; SINTERING; SOL-GEL PROCESS; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CADMIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; ENERGY-LEVEL TRANSITIONS; FABRICATION; IONS; LUMINESCENCE; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; SCATTERING; SILICATES; SILICON COMPOUNDS; SPECTRA; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.