Published November 22, 2005 | Version v1
Journal article

Optical characteristics of ZnS xSe1-x thin films prepared by electron beam evaporation

  • 1. Department of Physics and Mathematics, School of Engineering, UCSI, Lot 18113, Off Jalan Cerdas, Taman Connaught, 56000 Cheras, Kuala Lumpur (Malaysia)
  • 2. Department of Physics, University of Malaya, K.L. Malaysia (Malaysia)

Description

The optical transmission measurements are used to determine various optical constants and properties of ZnS xSe1-x thin films prepared by electron beam evaporation onto glass substrates at 60 deg. C. The dispersion of the complex refractive index, the complex dielectric function and the absorption coefficient is studied in the transparent region of the spectrum and compared with the theoretical results calculated based on the model dielectric function. The fundamental optical energy gap is estimated by fitting the absorption coefficient data in the high absorption region to the direct transition expression. The variation of the energy gap with the composition in the film is investigated and compared with the results reported previously by other workers. The shift in the energy gap caused by the uniaxial stress inside the film and the grain size effect is estimated

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.05.045;
PII
S0040-6090(05)00567-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
491
Journal Issue
1-2
Journal Page Range
p. 117-122
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.