Published August 2019 | Version v1
Journal article Metadata-only

Fabrication of (101)-oriented CsPbBr3 thick films with high carrier mobility using a mist deposition method

Creators

  • 1. Kyoto University, Graduate School of Energy Science, Kyoto (Japan)

Description

CsPbBr3 is a promising candidate for highly sensitive flat-panel X-ray detectors due to its excellent optoelectronic properties. Thus, a method of preparing thick CsPbBr3 films (>10 μm) over large areas (>10 × 10 cm2) is required. Herein, we report the fabrication of thick CsPbBr3 films using a scalable mist deposition method. In this method, the film thickness was controlled and up-scaled by the number of deposition cycles. The obtained CsPbBr3 films were composed of highly (101)-oriented columnar crystals and had a high carrier mobility of 13 cm2 V-1 s-1, which is comparable to that for single crystals. (author)

Availability note (English)

Available from https://doi.org/10.7567/1882-0786/ab2c96

Additional details

Identifiers

DOI
10.7567/1882-0786/ab2c96;

Publishing Information

Journal Title
Applied Physics Express (Online)
Journal Volume
12
Journal Issue
8
Journal Page Range
p. 085505.1-085505.4
ISSN
1882-0786

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
51005124
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CARRIER MOBILITY; CESIUM COMPOUNDS; CRYSTALLIZATION; DEPOSITION; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; FILMS; GRAIN BOUNDARIES; OPTOELECTRONIC DEVICES; RADIATION DETECTORS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; X-RAY DIFFRACTION
Descriptors DEC
ALKALI METAL COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MOBILITY; OPTICAL EQUIPMENT; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; TRANSDUCERS

Optional Information

Notes
43 refs., 4 figs., 1 tab.