Published February 1977 | Version v1
Journal article

Intrinsic efficiency of germanium: a basic for calculating expected detector efficiency

  • 1. Argonne National Lab., IL

Description

A method is presented whereby the intrinsic efficiency of Ge is utilized to calculate the expected peak efficiency of detectors having a wide range of sizes. The intrinsic efficiency of Ge, which is the probability for total absorption, was measured at 122 and 136 keV in Ge(Li) coaxial detectors and HPGe planar detectors having an effective thickness ranging from 5 to 50 mm. At 136 keV it is 64 percent for a thickness of 10 mm and 82 percent for 20 mm, after which it levels off reaching 89 percent at 50 mm. It is shown that the peak efficiency of a detector is a product of only the intrinsic efficiency and the solid angle, once losses due to edge escape and detector imperfections (surface channels and high dislocation densities) are determined. The absolute and relative [to NaI(Tl)] peak efficiency of a sample detector, calculated on the basis of intrinsic efficiency, are in good agreement with measured values. This method should find applications in the design of new detector systems particularly those for diagnostic imaging with 99Tc

Additional details

Additional titles

Augmented title (English)
Theoretical and experimental study

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
24
Journal Issue
1
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
88-92
ISSN
0018-9499

Conference

Title
23. nuclear science symposium.
Dates
20 Oct 1976.
Place
New Orleans, LA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
8348216
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EFFICIENCY; ENERGY LOSSES; GAMMA DETECTION; GE SEMICONDUCTOR DETECTORS; HIGH-PURITY GE DETECTORS; LI-DRIFTED GE DETECTORS; THICKNESS
Descriptors DEC
DIMENSIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
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