Intrinsic efficiency of germanium: a basic for calculating expected detector efficiency
- 1. Argonne National Lab., IL
Description
A method is presented whereby the intrinsic efficiency of Ge is utilized to calculate the expected peak efficiency of detectors having a wide range of sizes. The intrinsic efficiency of Ge, which is the probability for total absorption, was measured at 122 and 136 keV in Ge(Li) coaxial detectors and HPGe planar detectors having an effective thickness ranging from 5 to 50 mm. At 136 keV it is 64 percent for a thickness of 10 mm and 82 percent for 20 mm, after which it levels off reaching 89 percent at 50 mm. It is shown that the peak efficiency of a detector is a product of only the intrinsic efficiency and the solid angle, once losses due to edge escape and detector imperfections (surface channels and high dislocation densities) are determined. The absolute and relative [to NaI(Tl)] peak efficiency of a sample detector, calculated on the basis of intrinsic efficiency, are in good agreement with measured values. This method should find applications in the design of new detector systems particularly those for diagnostic imaging with 99Tc
Additional details
Additional titles
- Augmented title (English)
- Theoretical and experimental study
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 24
- Journal Issue
- 1
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 88-92
- ISSN
- 0018-9499
Conference
- Title
- 23. nuclear science symposium.
- Dates
- 20 Oct 1976.
- Place
- New Orleans, LA, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8348216
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EFFICIENCY; ENERGY LOSSES; GAMMA DETECTION; GE SEMICONDUCTOR DETECTORS; HIGH-PURITY GE DETECTORS; LI-DRIFTED GE DETECTORS; THICKNESS
- Descriptors DEC
- DIMENSIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
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