Hard X-ray diffraction scanning tomography with sub-micrometre spatial resolution. Application to an annealed γ-U0.85Mo0.15 particle
Creators
- 1. CEA, DEN, DEC, Cadarache, Saint Paul lez Durance (France)
- 2. ESRF, Grenoble (France)
- 3. CEA, LETI, MINATEC, Grenoble (France)
Description
It is demonstrated that scanning X-ray diffraction tomography of heterogeneous and polycrystalline samples can provide real-space semi-quantitative threedimensional structural information at a submicrometre spatial resolution. The capabilities of this technique are illustrated by the study of a slice of a spherical particle consisting of a UMo core (about 37 μm in diameter) surrounded by a UMoAl shell (5 μm thick). The technique allows precise characterization of the embedded UMo/UMoAl interface where the phases α-U (in the core), UAl2 and U6Mo4Al43 (in the shell) are found. Moreover, an unexpected phase (UC) is detected at a trace level. It is shown that the thickness of the UMoAl shell is locally anticorrelated with the amount of UC, suggesting that this phase plays a protective role in inhibiting thermally activated Al diffusion in UMo. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1107/S0021889811024423Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Applied Crystallography
- Journal Volume
- 44
- Journal Issue
- 5
- Journal Page Range
- p. 1111-1119
- ISSN
- 0021-8898
- CODEN
- JACGAR
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 42095149
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM ALLOYS; ANNEALING; BINARY ALLOY SYSTEMS; COMPOSITE MATERIALS; DENSITY; HARD X RADIATION; INTERFACES; KEV RANGE 10-100; MICROSTRUCTURE; MOLYBDENUM ALLOYS; OPACITY; PARTICLES; PHOTON COMPUTED TOMOGRAPHY; SCANNING ELECTRON MICROSCOPY; SHELLS; TERNARY ALLOY SYSTEMS; URANIUM ALLOYS; URANIUM-ALPHA; URANIUM-GAMMA; X-RAY DIFFRACTION
- Descriptors DEC
- ACTINIDE ALLOYS; ACTINIDES; ALLOY SYSTEMS; ALLOYS; COHERENT SCATTERING; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; HEAT TREATMENTS; IONIZING RADIATIONS; KEV RANGE; MATERIALS; METALS; MICROSCOPY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; TOMOGRAPHY; TRANSITION ELEMENT ALLOYS; URANIUM; X RADIATION