Design, fabrication and first beam tests of the C-band RF acceleration unit at SINAP
Creators
- 1. Shanghai Institute of Applied Physics (SINAP), Chinese Academy of Sciences, Shanghai 201800 (China)
- 2. Beijing Vacuum Electronic Research Institute, Beijing 100016 (China)
- 3. Department of Engineering Physics, Tsinghua University, Beijing 100084 (China)
Description
C-band RF acceleration is a crucial technology for the compact Free Electron Laser (FEL) facility at the Shanghai Institute of Applied Physics (SINAP), Chinese Academy of Sciences. A project focusing on C-band RF acceleration technology was launched in 2008, based on high-gradient accelerating structures powered by klystron and pulse compressor units. The target accelerating gradient is 40 MV/m or higher. Recently one prototype of C-band RF unit, consisting of a 1.8 m accelerating structure and a klystron with a TE0115 mode pulse compressor, has been tested with high-power and electron beam. Stable operation at 40 MV/m was demonstrated and, 50 MV/m approached by the end of the test. This paper introduces the C-band R&D program at SINAP and presents the experiment results of high-power and beam tests.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2016.03.101Additional details
Identifiers
- DOI
- 10.1016/j.nima.2016.03.101;
- PII
- S0168-9002(16)30147-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 823
- Journal Page Range
- p. 91-97
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48006158
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCELERATION; CHINA; COMPRESSORS; DESIGN; ELECTRON BEAMS; EXPERIMENT RESULTS; FABRICATION; FOCUSING; FREE ELECTRON LASERS; KLYSTRONS; OPERATION; PULSES
- Descriptors DEC
- ASIA; BEAMS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; LASERS; LEPTON BEAMS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PARTICLE BEAMS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.