Published November 1, 2007
| Version v1
Journal article
Ageing of CsI thin film photocathodes induced by UV photons
- 1. Department of Physics, Banaras Hindu University, Varanasi 221005 (India)
- 2. INFN-Sezione di Bari, c/o Dipartimento Interateneo di Fisica 'Michelangelo Merlin', Via G. Amendola 173, 70126 Bari (Italy)
- 3. Dipartimento di Fisica 'G. Marconi', Universita di Roma 'La Sapienza', P.le A. Moro 2, 00185 Rome (Italy)
- 4. Dipartimento di Chimica Generale e Inorganica, Universita di Roma 'La Sapienza', P.le A. Moro 2, 00185 Rome (Italy)
Description
The degradation of CsI thin film photocathodes (PCs) under UltraViolet (UV) irradiation has been investigated by measuring the photocurrent as well as the absolute Quantum Efficiency (QE) as a function of the accumulated charge density. Atomic Force Microscopy (AFM) and UV Photoemission Electron Microscopy (PEEM) have been employed to study the surface morphology and the local QE of polycrystalline CsI thin films and their transformation due to UV irradiation. The photoemissive properties of CsI PCs, together with their surface morphology, have been found to be strongly affected by the UV photon ageing
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.08.121Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.08.121;
- PII
- S0168-9002(07)01821-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 581
- Journal Issue
- 3
- Journal Page Range
- p. 651-655
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39064120
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AGING; ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; IRRADIATION; MORPHOLOGY; PHOTOCATHODES; PHOTODETECTORS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTONS; POLYCRYSTALS; QUANTUM EFFICIENCY; SURFACES; THIN FILMS; ULTRAVIOLET RADIATION
- Descriptors DEC
- BOSONS; CATHODES; CRYSTALS; EFFICIENCY; ELECTRODES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; EMISSION; FILMS; MASSLESS PARTICLES; MICROSCOPY; RADIATIONS; SECONDARY EMISSION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.