Published 1996
| Version v1
Miscellaneous
High resolution PITS studies of deep-level defects in semi-insulating GaAs and InP
- 1. Institute of Electronic Materials Technology, Warsaw (Poland)
- 2. Military University of Technology, Warsaw (Poland)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of 12. Conference on Solid State Crystals Materials Science and Applications
- Imprint Pagination
- [O 1-52; A 1-25; B 1-35; C 1-37; D 1-31]
- Journal Page Range
- p. C-11
Conference
- Title
- 12. Conference on Solid State Crystals Materials Science and Applications
- Dates
- 7-11 Oct 1996
- Place
- Zakopane (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 30020229
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- CRYSTAL DEFECTS; ELECTRON SPIN RESONANCE; ENERGY LEVELS; GALLIUM ARSENIDES; INDIUM PHOSPHIDES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CRYSTAL STRUCTURE; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; MAGNETIC RESONANCE; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; RESONANCE