Compound Semiconductor Radiation Detector
Creators
- 1. Korea Atomic Energy Research Institute, Taejon (Korea, Republic of)
Description
In 1945, Van Heerden measured α, β and γ radiations with the cooled AgCl crystal. It was the first radiation measurement using the compound semiconductor detector. Since then the compound semiconductor has been extensively studied as radiation detector. Generally the radiation detector can be divided into the gas detector, the scintillator and the semiconductor detector. The semiconductor detector has good points comparing to other radiation detectors. Since the density of the semiconductor detector is higher than that of the gas detector, the semiconductor detector can be made with the compact size to measure the high energy radiation. In the scintillator, the radiation is measured with the two-step process. That is, the radiation is converted into the photons, which are changed into electrons by a photo-detector, inside the scintillator. However in the semiconductor radiation detector, the radiation is measured only with the one-step process. The electron-hole pairs are generated from the radiation interaction inside the semiconductor detector, and these electrons and charged ions are directly collected to get the signal. The energy resolution of the semiconductor detector is generally better than that of the scintillator. At present, the commonly used semiconductors as the radiation detector are Si and Ge. However, these semiconductor detectors have weak points. That is, one needs thick material to measure the high energy radiation because of the relatively low atomic number of the composite material. In Ge case, the dark current of the detector is large at room temperature because of the small band-gap energy. Recently the compound semiconductor detectors have been extensively studied to overcome these problems. In this paper, we will briefly summarize the recent research topics about the compound semiconductor detector. We will introduce the research activities of our group, too
Additional details
Publishing Information
- Publisher
- KNS
- Imprint Place
- Taejon (Korea, Republic of)
- Imprint Title
- Proceedings of the KNS autumn meeting
- Imprint Pagination
- [1 CD-ROM]
- Journal Page Range
- [2 p.]
Conference
- Title
- 2005 autumn meeting of the KNS
- Dates
- 27-28 Oct 2005
- Place
- Busan (Korea, Republic of)
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 37076079
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BULK SEMICONDUCTOR DETECTORS; COMPARATIVE EVALUATIONS; ENERGY RESOLUTION; GE SEMICONDUCTOR DETECTORS; RADIATION DETECTION; SI SEMICONDUCTOR DETECTORS; SIGNALS
- Descriptors DEC
- DETECTION; EVALUATION; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- 4 refs, 2 figs