Published May 15, 2014
| Version v1
Journal article
A current modulation in the Gd2O3/Si/Gd2O3 quantum well structure as a mean to monitor oxygen vacancies
- 1. Department of Physics and Optical Science, UNC-Charlotte, Charlotte, NC 28223 (United States)
- 2. Electrical and Computer Engineering Department, UNC-Charlotte, Charlotte, NC 28223 (United States)
Description
The Gd2O3 layer grown by electron beam evaporation system normally leads to oxygen deficient sites unless the oxygen partial pressure is provided. These oxygen vacancies were monitored through their current modulating effect. This modulation controlled the current within a Si well of the Gd2O3/Si/Gd2O3 quantum well structure through the migration of the oxygen vacancies. Such behavior were not found in the structure that contains far less oxygen vacancy such as SiO2/Si/SiO2 structure
Additional details
Identifiers
- DOI
- 10.1063/1.4878297;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1598
- Journal Issue
- 1
- Journal Page Range
- p. 146-149
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 7. international conference on low dimensional structures and devices
- Acronym
- LDSD 2011
- Dates
- 22-27 May 2011
- Place
- Telchac (Mexico)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45101651
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL GROWTH; ELECTRIC CURRENTS; ELECTRON BEAMS; ENERGY BEAM DEPOSITION; GADOLINIUM OXIDES; HETEROJUNCTIONS; LAYERS; MODULATION; OXYGEN; PARTIAL PRESSURE; QUANTUM WELLS; SILICON; SILICON OXIDES; VACANCIES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; DEPOSITION; ELEMENTS; GADOLINIUM COMPOUNDS; LEPTON BEAMS; NANOSTRUCTURES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHYSICAL PROPERTIES; POINT DEFECTS; RARE EARTH COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SILICON COMPOUNDS; SURFACE COATING; THERMODYNAMIC PROPERTIES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC