Practical limitations to selenium annealing of compound co-sputtered Cu2ZnSnS4 as a route to achieving sulfur-selenium graded solar cell absorbers
- 1. Ångström Laboratory, Div. Solid State Electronics, Department of Engineering Science, Uppsala University, Box 534, Uppsala SE-75121 (Sweden)
- 2. Department of Physics, Centre for Materials Science and Nanotechnology, University of Oslo, P. O. Box 1048 Blindern, Oslo N-0316 (Norway)
Description
The suitability of selenium annealing as a technique to introduce energy band gap gradients via sulfur-selenium substitution in Cu2ZnSnS4 (CZTS) films is evaluated. Compound co-sputtered CZTS precursors are annealed in selenium atmosphere at 425°C, either as-deposited or after a short time sulfur pre-anneal. The films are investigated by Raman spectroscopy and X-ray diffractometry, and the spatial distribution of elemental species measured by secondary ion mass spectrometry and energy dispersive X-ray spectroscopy. Sulfur-selenium gradients are not achieved for the as-deposited precursor. Sulfur-selenium gradients are achieved in the early stages of annealing for pre-anneal samples, where Cu2ZnSn(S,Se)4 (CZTSSe) formation is found to be correlated spatially with sodium distribution. These gradients are lost as the annealing progresses. Selenisation occurs by CZTSSe grain growth, rather than by direct substitution of selenium for sulfur. The spatial correlation of high sodium concentration with CZTSSe formation suggests that liquid-phase sodium selenide facilitates selenium incorporation during recrystallisation, limiting the practicality of anion-grading of CZTSSe during the annealing step as a means of establishing a graded band gap. - Highlights: • Selenium annealing of compound co-sputtered CZTS precursors is investigated. • Sulfur-selenium gradients in sulfur pre-annealed precursors form near the back contact. • Selenisation is correlated with sodium distribution. • Sodium assisted recrystallisation limits practicality of Se annealing for S-Se gradient formation.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2016.12.044Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2016.12.044;
- PII
- S0040-6090(16)30857-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 623
- Journal Page Range
- p. 110-115
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50023807
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANIONS; ANNEALING; CDZNTE SEMICONDUCTOR DETECTORS; CONCENTRATION RATIO; CRYSTALLIZATION; DEPOSITS; DIFFUSION; GRADED BAND GAPS; GRAIN GROWTH; LIQUIDS; MASS SPECTROSCOPY; RAMAN SPECTROSCOPY; RECRYSTALLIZATION; SODIUM; SOLAR CELLS; SPUTTERING; SULFUR; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALI METALS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; DIRECT ENERGY CONVERTERS; ELEMENTS; EQUIPMENT; FLUIDS; HEAT TREATMENTS; IONS; LASER SPECTROSCOPY; MEASURING INSTRUMENTS; METALS; NONMETALS; PHASE TRANSFORMATIONS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SOLAR EQUIPMENT; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.