Published December 8, 2008
| Version v1
Journal article
Light-Induced Tellurium Enrichment on CdZnTe Crystal Surfaces Detected by Raman Spectroscopy
Creators
- 1. Fisk University, Nashville, TN (United States)
- 2. National Institute of Standards and Technology, Gaithersburg, MD (United States)
- 3. Savannah River National Laboratory, Aiken, SC (United States)
Description
CdZnTe (CZT) crystals can be grown under controlled conditions to produce high-quality crystals to be used as room-temperature radiation detectors. Even the best crystal growth methods result in defects, such as tellurium secondary phases, that affect the crystal's performance. In this study, CZT crystals were analyzed by micro-Raman spectroscopy. The growth of Te rich areas on the surface was induced by low-power lasers. The growth was observed versus time with low-power Raman scattering and was observed immediately under higher-power conditions. The detector response was also measured after induced Te enrichment.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Electronic Materials
- Journal Volume
- 37
- Journal Issue
- 9
- Journal Page Range
- p. 1438-1443
- ISSN
- 0361-5235
- CODEN
- JECMA5
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 42056185
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMBIENT TEMPERATURE; CADMIUM TELLURIDES; CRYSTAL GROWTH; CRYSTAL GROWTH METHODS; CRYSTALS; DEFECTS; ENRICHMENT; GROWTH; LASERS; PERFORMANCE; RADIATION DETECTORS; RAMAN SPECTROSCOPY; SCATTERING; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; SURFACES; TELLURIUM; ZINC TELLURIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; ELEMENTS; LASER SPECTROSCOPY; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMIMETALS; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Notes
- doi 10.1007/s11664-008-0448-x
- Funding organization
- US Department of Energy (United States)