Monitoring photodeposition of polymer films from diacetylene monomer solutions using in situ real-time spectroscopic ellipsometry
Description
Photodeposition of thin polymer (PDAMNA) films from diacetylene monomer (DAMNA) solutions onto 80 A gold coated silica substrates with UV light was studied using the technique of in situ real-time spectroscopic ellipsometry. The dielectric function of the PDAMNA film was determined, and it reveals typical optical properties for organic materials in the photon energy range (1.6-2.7 eV). The thickness of a growing PDAMNA film over a 4-h time interval was determined using a linear regression fit of the experimental data to a homogeneous four phase optical model. The growth rate was observed to be essentially linear with time during the early stages of photodeposition, as expected. However, it was found that stirring the solution dramatically lowered the rate of film deposition. It is believed that fluid flow enhances transport of reactive species generated in the vicinity of the substrate away from the surface and into the bulk solution, where they become quenched. Lastly, the morphology of the PDAMNA film was examined using non-contact mode atomic force microscopy, indicating that the film contains embedded aggregates of precipitated polymer with diameters ranging from 20 to 100 nm. These results are consistent with those obtained previously using optical microscopy
Additional details
Identifiers
- DOI
- 10.1016/S0040-6090;
- PII
- S0040609003006771;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 437
- Journal Issue
- 1-2
- Journal Page Range
- p. 127-134
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013450
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DEPOSITION; DIELECTRIC MATERIALS; ELLIPSOMETRY; EV RANGE 01-10; EXPERIMENTAL DATA; FILMS; FLUID FLOW; GOLD; MONITORING; MONOMERS; MORPHOLOGY; OPTICAL MICROSCOPY; OPTICAL MODELS; OPTICAL PROPERTIES; PHOTONS; POLYMERS; SILICA; SOLUTIONS; SUBSTRATES; SURFACES; THICKNESS; ULTRAVIOLET RADIATION
- Descriptors DEC
- BOSONS; DATA; DIMENSIONS; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; EV RANGE; HOMOGENEOUS MIXTURES; INFORMATION; MASSLESS PARTICLES; MATERIALS; MATHEMATICAL MODELS; MEASURING METHODS; METALS; MICROSCOPY; MINERALS; MIXTURES; NUMERICAL DATA; OXIDE MINERALS; PHYSICAL PROPERTIES; RADIATIONS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.