Published July 1980
| Version v1
Journal article
Space-charge controlled conduction in thick metal-insulator-metal barriers
- 1. Materials Research Laboratory and Department of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802
Description
Numerical solutions of the (field and diffusion) transport equations yield energy and concentration contours for thick M1-I-M2 (metal-insulator-metal) barriers, and their appropriate current-voltage relationships, with and without traps. Traps must ordinarily be expected in such films, and it is shown that they result in a curvature of the barrier profile, which exercises a controlling influence over I-V characteristics in the forward direction
Additional details
Publishing Information
- Journal Title
- J. Appl. Phys.
- Journal Volume
- 51
- Journal Issue
- 7
- Series
- J. Appl. Phys.
- Journal Page Range
- 3790-3793
- ISSN
- 0021-8979
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 11559182
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- CONTROL; DIFFUSION; ELECTRIC CONDUCTIVITY; ELECTRICAL INSULATORS; ENERGY SPECTRA; FILMS; MATHEMATICAL MODELS; METALS; SPACE CHARGE; THICKNESS; TRANSPORT THEORY; TRAPS
- Descriptors DEC
- DIMENSIONS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELEMENTS; PHYSICAL PROPERTIES; SPECTRA