Published 1980
| Version v1
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Ion-implantation-induced phase separation and crystallization in lithia-silica glasses
Description
Crystallization of annealed Li2O.2SiO2 glasses implanted with inert ions and fused SiO2 glass implanted with Li ions was monitored using infrared reflection spectroscopy. Elastic recoil detection analysis was used to study changes in the Li and H concentration induced in these glasses by implantation and annealing. Implantation of Li2O.2SiO2 with inert ions results in Li depletion, accompanied by H indiffusion, in the implanted region. For Li-implanted SiO2, crystallization of α-quartz is accompanied by appreciable Li diffusion to the surface and attendant H migration to the Li-depleted region. The crystallization mechanisms are discussed in terms of phase separation in the lithia-silica system
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A03/MF A01.Files
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Additional details
Publishing Information
- Imprint Pagination
- 26 p.
- Report number
- SAND--80-0823C
Conference
- Title
- Ion beam modification of materials conference.
- Dates
- 14 - 18 Jul 1980.
- Place
- Albany, NY, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 11564884
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; DIFFUSION; GLASS; HYDROGEN; ION IMPLANTATION; LITHIUM; LITHIUM OXIDES; SILICON OXIDES
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALI METALS; CHALCOGENIDES; ELEMENTS; HEAT TREATMENTS; LITHIUM COMPOUNDS; METALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-800744--5.