Published April 1, 2005 | Version v1
Journal article

Status of the Belle Silicon Vertex Detector

  • 1. KEK, High Energy Accelerator research Organization, 1-1 Oho, Tsukuba-shi, Ibaraki-ken 305-080 (Japan)
  • 2. Niigata Graduate School of Science and Technology, Niigata university, Niigata 950-2181 (Japan)
  • 3. Tohoku University (Japan)
  • 4. University of Tokyo, Department of Physics, 7-3-1, Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

Description

The Silicon Vertex Detector (SVD) of the Belle experiment is one of the main components for the investigation of time-dependent CP-asymmetries at the B-factory at KEK. The first version of this device (SVD1) was operated for 4 years starting in 1999 with excellent performance. However, its major limitations necessitated the design of a new detector (SVD2) which was installed in the summer shutdown of 2003. The improvements of the hardware and first results on the performance under real beam conditions are presented

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.038;
PII
S0168-9002(05)00050-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
541
Journal Issue
1-2
Journal Page Range
p. 61-66
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international symposium on development and application of semiconductor tracking detectors
Acronym
STD 5
Dates
14-17 Jun 2004
Place
Hiroshima (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033544
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESIGN; EQUIPMENT; JAPANESE ORGANIZATIONS; PERFORMANCE; SI SEMICONDUCTOR DETECTORS; SYMMETRY; TIME DEPENDENCE
Descriptors DEC
MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.