Influence of the charge changing processes on proton induced electron emission from polycrystalline aluminium
Creators
Description
Charge changing processes are known to have a strong influence on ion-induced electron emission characteristics. However, up to now, only a few theoretical models incorporate electron capture and loss cross-sections. For protons with velocities around 1 a.u., a correct theoretical model of the various charge changing processes undergone by the proton is necessary. In particular, all the electrons excited in the different processes have to be taken into account. It is precisely the aim of the present paper to give a description of all the possible charge changing processes and to incorporate these processes in a Monte Carlo simulation of proton induced electron emission from polycrystalline aluminium. The influence of charge changing processes on backward electron emission yield is evaluated. The contributions of H+, H0, H- fractions as well as of electrons excited by the charge changing processes for incident H+ (1<v<2 a.u.) on polycrystalline aluminium are also discussed
Additional details
Identifiers
- PII
- S0168583X02021717;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 203
- Journal Issue
- 2-3
- Journal Page Range
- p. 36-40
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34038351
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; CHARGE EXCHANGE; CROSS SECTIONS; ELECTRON CAPTURE; ELECTRON EMISSION; HYDROGEN IONS; HYDROGEN IONS 1 MINUS; HYDROGEN IONS 1 PLUS; MONTE CARLO METHOD; POLYCRYSTALS; PROTON BEAMS
- Descriptors DEC
- ANIONS; BEAMS; CALCULATION METHODS; CAPTURE; CATIONS; CHARGED PARTICLES; CRYSTALS; ELEMENTS; EMISSION; HYDROGEN IONS; IONS; METALS; NUCLEON BEAMS; PARTICLE BEAMS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.