Na2O doped CeO2 and their structural, optical, conducting and dielectric properties
Creators
- 1. School of Physics and Materials Science, Thapar Institute of Engineering and Technology, Patiala, 147004 (India)
Description
Highlights: • All the samples are synthesized by solid state reaction method. • The dielectric constant decreased after addition of Na2O in CeO2 based samples. • Charge difference between Na2+ and Ce4+ is not enhancing the conductivity of the base material. • Low concentration of the dopant exhibits the highest conductivity with the lowest relaxation time. - Abstract: In the present study, Na2O doped CeO2 has been prepared by solid state reaction method. The prepared samples are characterized by X-ray diffraction (XRD), UV–Visible spectroscopy, Fourier transform infrared (FTIR) spectroscopy, Scanning electron microscope (SEM) and Impedance spectroscopy. The optical band gap of all the samples lies in the semiconducting range i.e. 3.04–3.25 eV. The highest optical band gap is observed for 5 mol% Na2O doped CeO2. The SEM images show a non-uniform distribution of particles with an average particle size of ∼3.15 μm for all the samples. The lowest dielectric constant is observed to be ∼11 at 100 °C and 100 Hz for 10 mol% doped CeO2 which is lower than the undoped CeO2. The conductivity of the samples lies in the range of 10−7 S/cm at 700 °C.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2018.08.036Additional details
Identifiers
- DOI
- 10.1016/j.physb.2018.08.036;
- PII
- S0921452618305180;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 550
- Journal Page Range
- p. 189-198
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50029102
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CERIUM IONS; CERIUM OXIDES; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DOPED MATERIALS; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; OXIDATION; PARTICLE SIZE; RELAXATION TIME; SCANNING ELECTRON MICROSCOPY; SODIUM OXIDES; SPECTROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CERIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; IONS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; SCATTERING; SIZE; SODIUM COMPOUNDS; SPECTRA; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.