In situ investigation of subcritical crack growth in lead zirconate titanate ceramics using atomic force microscopy
Creators
- 1. Advanced Ceramics Group, Hamburg University of Technology, Denickestr. 15, 21073 Hamburg (Germany)
- 2. Robert Bosch GmbH, Corporate Research and Development, P.O. Box 10 60 50, 70049 Stuttgart (Germany)
Description
Crack-velocity-curves (v-K-curves) as well as R-curves of unpoled and poled lead zirconate titanate are investigated by directly observing the crack extension in compact tension specimens. Depending on the velocity range, either optical microscopy or atomic force microscopy is used for this purpose. With this method a broad velocity range of eight orders of magnitude down to 10-13 m s-1 is covered. A threshold K I,th is proposed for both states of the material. It is found that poling of the material elevates the threshold value by 35%. This corresponds to the increase of the intrinsic fracture toughness determined from the R-curves. At higher velocities the influence of the R-curve effect on subcritical crack growth is discussed by means of time dependent ferroelastic switching processes
Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2005.05.010;
- PII
- S1359-6454(05)00286-7;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 53
- Journal Issue
- 15
- Journal Page Range
- p. 4051-4056
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37055858
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CERAMICS; COMPACTS; CRACK PROPAGATION; CRACKS; DIAGRAMS; FRACTURE PROPERTIES; OPTICAL MICROSCOPY; PEROVSKITES; PZT; TIME DEPENDENCE; VELOCITY
- Descriptors DEC
- INFORMATION; LEAD COMPOUNDS; MECHANICAL PROPERTIES; MICROSCOPY; MINERALS; OXYGEN COMPOUNDS; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONATES; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.