Published August 6, 1981 | Version v1
Report Restricted

X-ray microscopy using grazing-incidence reflection optics

Description

The Kirkpatrick-Baez microscopes are described along with their role as the workhorse of the x-ray imaging devices. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

Files

Restricted

The record is publicly accessible, but files are restricted to users with access.

Additional details

Publishing Information

Imprint Pagination
13 p.
Report number
UCRL--86046

Conference

Title
1981 topical conference on low-energy X-ray diagnostics.
Dates
8 - 10 Jun 1981.
Place
Livermore, CA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
12639921
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
MIRRORS; PERFORMANCE; PLASMA DIAGNOSTICS; REFLECTION; SHIVA FACILITY; X-RAY SPECTRA; X-RAY SPECTROMETERS
Descriptors DEC
MEASURING INSTRUMENTS; SPECTRA; SPECTROMETERS

Optional Information

Secondary number(s)
CONF-810651--6.