Published 2017 | Version v1
Journal article Metadata-only

Measurement of spatial dose distribution of high radiation field by radiophotoluminescence photography [Radiation Safety Management Onlin)]

Creators

  • 1. Osaka University, Graduate School of Engineering, Suita, Osaka (Japan)
  • 2. Osaka University, Radioisotope Research Center, Toyonaka, Osaka (Japan)
  • 3. Chiyoda Technol Corporation, Oarai Research Center, Oarai, Ibaraki (Japan)
  • 4. Electron Science Institute, Osaka (Japan)

Description

Radiophotoluminescence (RPL) photography has been proposed for the measurement of the spatial dose distribution of high radiation fields. A pulsed UV-LED illuminator was prepared as an excitation light source for the RPL photography. The fluorescence image of RPL material was observed by a gated intensified CCD camera. In a preliminary experiment, several tens of spherical RPL detectors were placed near an intense 60Co source. The pulsed UV-LED illuminator and the gated intensified camera were pulse-operated to obtain the RPL photograph of the ball-shaped RPL detectors. The spatial dose distribution was calculated from the brightness of obtained RPL images. (author)

Availability note (English)

Available from http://dx.doi.org/10.12950/rsm.170614

Additional details

Identifiers

DOI
10.12950/rsm.170614;

Publishing Information

Journal Title
Radiation Safety Management (Online)
Journal Volume
16
Journal Page Range
p. 13-19
ISSN
1884-9520

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
49083083
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Translation
Descriptors DEI
ABSORBED RADIATION DOSES; BRIGHTNESS; CHARGE-COUPLED DEVICES; FLUORESCENCE; ILLUMINANCE; IMAGES; LIGHT EMITTING DIODES; LIGHT SOURCES; PHOSPHATE GLASS; PHOTOGRAPHY; RADIOSENSITIVITY; RPL DOSEMETERS; SILVER IONS; SPATIAL DOSE DISTRIBUTIONS; ULTRAVIOLET RADIATION; WAVELENGTHS
Descriptors DEC
CHARGED PARTICLES; DOSEMETERS; DOSES; ELECTROMAGNETIC RADIATION; EMISSION; GLASS; IONS; LUMINESCENCE; LUMINESCENT DOSEMETERS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHOTON EMISSION; PHYSICAL PROPERTIES; RADIATION DOSE DISTRIBUTIONS; RADIATION DOSES; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SENSITIVITY

Optional Information

Notes
Translated from 'Nippon Hoshasen Anzen Kanri Gakkai-Shi', v. 15(1), p. 40-45 (2016); 8 refs., 10 figs.