Published 1990
| Version v1
Miscellaneous
The occurrence of detrital diamond and moissanite in the fossil Witwatersrand placers and its implication for the evolution of the ancient continent
Creators
- 1. Department of Geology, University of Stellenbosch, Stellenbosch (South Africa)
- 2. Anglo American Research Labs., Crown Mines (South Africa)
Description
Although a rare component, the occurrence of detrital diamonds in Witwatersrand placers has been reported from localities as much as 200 km apart. Brown and green colour spots on the surface of the diamonds as well as associated etched surfaces point to radiation damage during their burial in uraniferous rock. At least two periods of radiation damage are evident. The occurrence of moissanite in kimberlite and its association with diamond has been reported from other deposits. Attempts were made to determine the trace element content of single moissanite grains using PIXE. In contrast to artificial SiC no trace elements could be detected in moissanite from reefs. 4 refs., 1 fig
Additional details
Publishing Information
- Imprint Title
- Abstracts Geocongress '90
- Imprint Pagination
- 787 p.
- Journal Page Range
- p. 188-191.
Conference
- Title
- 23. Earth science congress of the Geological Society of South Africa.
- Dates
- 2-6 Jul 1990.
- Place
- Cape Town (South Africa).
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 23070961
- Subject category
- S58: GEOSCIENCES;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CONGLOMERATES; DIAMONDS; INFRARED RADIATION; IRRADIATION; KIMBERLITES; NITROGEN; PHYSICAL RADIATION EFFECTS; PIXE ANALYSIS; PLACERS; SILICON CARBIDES; WITWATERSRAND
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; GEOLOGIC DEPOSITS; IGNEOUS ROCKS; MINERALS; MOUNTAINS; NONDESTRUCTIVE ANALYSIS; NONMETALS; PERIDOTITES; PLUTONIC ROCKS; RADIATION EFFECTS; RADIATIONS; ROCKS; SILICON COMPOUNDS; X-RAY EMISSION ANALYSIS