High-resolution threshold photoionization of N2O
- 1. Department of Chemistry, Purdue University, West Lafayette, Indiana 47907-3699 (USA)
- 2. Chemistry Department, Brookhaven National Laboratory, Upton, New York 11973 (USA)
Description
Pulsed field ionization (PFI) has been used in conjunction with a coherent vuv source to obtain high-resolution threshold photoelectron spectra for the (000), (010), (020), and (100) vibrational states of the N2O+ cation. Simulations for the rotational profiles of each vibronic level were obtained by fitting the Buckingham--Orr--Sichel equations [A. D. Buckingham, B. J. Orr, and J. M. Sichel, Philos. Trans. R. Soc. London, Ser. A 268, 147 (1970)] using accurate spectroscopic constants for the ground states of the neutral and the ion. The relative branch intensities are interpreted in terms of the partial waves of the outgoing photoelectron to which the ionic core is coupled and in terms of the angular momentum transferred to the core. The PFI technique also allows us to report an improved value for the ionization potential of N2O of 103 963±5 cm-1
Additional details
Publishing Information
- Journal Title
- Journal of Chemical Physics
- Journal Volume
- 95
- Journal Issue
- 2
- Series
- J. Chem. Phys.
- Journal Page Range
- 746-753
- ISSN
- 0021-9606
- CODEN
- JCPSA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22073867
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- IONIZATION POTENTIAL; NITROUS OXIDE; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; RYDBERG STATES
- Descriptors DEC
- CHALCOGENIDES; ELECTRON SPECTROSCOPY; ENERGY LEVELS; EXCITED STATES; IONIZATION; NITROGEN COMPOUNDS; NITROGEN OXIDES; OXIDES; OXYGEN COMPOUNDS; SPECTROSCOPY