Performance assessment by Monte Carlo simulations of a prospective assembly of up to three HPGe detectors designed for superior detection efficiency and sensitivity
Description
The present work reports on the results of Monte Carlo simulations performed with MCNP on an assembly of two HPGe detectors facing each other regarding detector efficiencies. Report is also made when a third detector is added to the previous configuration from below. Moreover cross talk between detectors is investigated and found of limited impact. The choice for an actual detector goes to the three detector configuration for accommodating most geometries while cost and engineering constrains remain acceptable. - Highlights: ► Gain is doubled in FEP efficiency for twin detectors for most sample geometries. ► Gain is less than threefold in configurations of three detectors. ► Cross talk between detectors is small. ► Detection sensitivity is increased as FEP efficiency.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apradiso.2012.02.083Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2012.02.083;
- PII
- S0969-8043(12)00131-5;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 70
- Journal Issue
- 9
- Journal Page Range
- p. 1969-1973
- ISSN
- 0969-8043
- CODEN
- ARISEF
Conference
- Title
- 18. international conference on radionuclide metrology and its applications
- Dates
- 19-23 Sep 2011
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44101165
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; MONTE CARLO METHOD; PERFORMANCE; RADIATION DETECTION; SENSITIVITY
- Descriptors DEC
- CALCULATION METHODS; DETECTION; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.