Published September 2012 | Version v1
Journal article

Performance assessment by Monte Carlo simulations of a prospective assembly of up to three HPGe detectors designed for superior detection efficiency and sensitivity

  • 1. CEA, DAM, DIF, F-91297 Arpajon (France)

Description

The present work reports on the results of Monte Carlo simulations performed with MCNP on an assembly of two HPGe detectors facing each other regarding detector efficiencies. Report is also made when a third detector is added to the previous configuration from below. Moreover cross talk between detectors is investigated and found of limited impact. The choice for an actual detector goes to the three detector configuration for accommodating most geometries while cost and engineering constrains remain acceptable. - Highlights: ► Gain is doubled in FEP efficiency for twin detectors for most sample geometries. ► Gain is less than threefold in configurations of three detectors. ► Cross talk between detectors is small. ► Detection sensitivity is increased as FEP efficiency.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2012.02.083

Additional details

Identifiers

DOI
10.1016/j.apradiso.2012.02.083;
PII
S0969-8043(12)00131-5;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
70
Journal Issue
9
Journal Page Range
p. 1969-1973
ISSN
0969-8043
CODEN
ARISEF

Conference

Title
18. international conference on radionuclide metrology and its applications
Dates
19-23 Sep 2011
Place
Tsukuba (Japan)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44101165
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED SIMULATION; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; MONTE CARLO METHOD; PERFORMANCE; RADIATION DETECTION; SENSITIVITY
Descriptors DEC
CALCULATION METHODS; DETECTION; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.