Particle tracking during Ostwald ripening using time-resolved laboratory X-ray microtomography
Creators
- 1. Ulm University, Institute of Micro and Nanomaterials, Albert-Einstein-Allee 47, 89081 (Germany)
- 2. Ulm University, Institute of Orthopaedic Research and Biomechanics, Helmholtzstrasse 14, 89081 (Germany)
Description
Laboratory X-ray microtomography is investigated as a method for obtaining time-resolved images of microstructural coarsening of the semisolid state of Al–5 wt.% Cu samples during Ostwald ripening. Owing to the 3D imaging capability of tomography, this technique uniquely provides access to the growth rates of individual particles, thereby not only allowing a statistical characterization of coarsening—as has long been possible by conventional metallography—but also enabling quantification of the influence of local environment on particle boundary migration. The latter information is crucial to understanding growth kinetics during Ostwald ripening at high volume fractions of the coarsening phase. Automated image processing and segmentation routines were developed to close gaps in the network of particle boundaries and to track individual particles from one annealing step to the next. The particle tracking success rate places an upper bound of only a few percent on the likelihood of segmentation errors for any given particle. The accuracy of particle size trajectories extracted from the time-resolved tomographic reconstructions is correspondingly high. Statistically averaged coarsening data and individual particle growth rates are in excellent agreement with the results of prior experimental studies and with computer simulations of Ostwald ripening. - Highlights: • Ostwald ripening in Al–5 wt.% Cu measured by laboratory X-ray microtomography • Time-resolved measurement of individual particle growth • Automated segmentation routines developed to close gaps in particle boundary network • Particle growth/shrinkage rates deviate from LSW model prediction
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchar.2014.01.022Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2014.01.022;
- PII
- S1044-5803(14)00035-7;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 90
- Journal Page Range
- p. 185-195
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46046670
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; ANNEALING; COMPUTERIZED SIMULATION; IMAGE PROCESSING; MICROSTRUCTURE; PARTICLE SIZE; PARTICLE TRACKS; PARTICLES; SHRINKAGE; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; HEAT TREATMENTS; IONIZING RADIATIONS; PROCESSING; RADIATIONS; SIMULATION; SIZE
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.