Published April 2014 | Version v1
Journal article

Particle tracking during Ostwald ripening using time-resolved laboratory X-ray microtomography

  • 1. Ulm University, Institute of Micro and Nanomaterials, Albert-Einstein-Allee 47, 89081 (Germany)
  • 2. Ulm University, Institute of Orthopaedic Research and Biomechanics, Helmholtzstrasse 14, 89081 (Germany)

Description

Laboratory X-ray microtomography is investigated as a method for obtaining time-resolved images of microstructural coarsening of the semisolid state of Al–5 wt.% Cu samples during Ostwald ripening. Owing to the 3D imaging capability of tomography, this technique uniquely provides access to the growth rates of individual particles, thereby not only allowing a statistical characterization of coarsening—as has long been possible by conventional metallography—but also enabling quantification of the influence of local environment on particle boundary migration. The latter information is crucial to understanding growth kinetics during Ostwald ripening at high volume fractions of the coarsening phase. Automated image processing and segmentation routines were developed to close gaps in the network of particle boundaries and to track individual particles from one annealing step to the next. The particle tracking success rate places an upper bound of only a few percent on the likelihood of segmentation errors for any given particle. The accuracy of particle size trajectories extracted from the time-resolved tomographic reconstructions is correspondingly high. Statistically averaged coarsening data and individual particle growth rates are in excellent agreement with the results of prior experimental studies and with computer simulations of Ostwald ripening. - Highlights: • Ostwald ripening in Al–5 wt.% Cu measured by laboratory X-ray microtomography • Time-resolved measurement of individual particle growth • Automated segmentation routines developed to close gaps in particle boundary network • Particle growth/shrinkage rates deviate from LSW model prediction

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchar.2014.01.022

Additional details

Identifiers

DOI
10.1016/j.matchar.2014.01.022;
PII
S1044-5803(14)00035-7;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
90
Journal Page Range
p. 185-195
ISSN
1044-5803
CODEN
MACHEX

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46046670
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACCURACY; ANNEALING; COMPUTERIZED SIMULATION; IMAGE PROCESSING; MICROSTRUCTURE; PARTICLE SIZE; PARTICLE TRACKS; PARTICLES; SHRINKAGE; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; HEAT TREATMENTS; IONIZING RADIATIONS; PROCESSING; RADIATIONS; SIMULATION; SIZE

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.