Published December 1993 | Version v1
Journal article

Relaxation and thermal hysteresis in the electrical resistivity of (Nd1.6Sr0.4)NiO4+δ compounds

  • 1. Centro de Fisica, Univ. of Porto (INIC) and IFIMUP (IMAT), Porto (Portugal)
  • 2. Physics Dept., Univ. of Warwick, Coventry (United Kingdom)

Description

We have measured the electrical resistivity from 10-300 K of two nominally identical samples of (Nd1.6Sr0.4)NiO4+δ. Both samples display clear semiconductor-like behaviour down to ∼70 K. Below there are a series of transitional effects associated with metallic and magnetic behaviour. Since both samples are in the critical range where the tetragonal structure is being stabilised the behaviour is sample dependent. It is shown that both magnetic and structural effects influence the thermal hysteresis present in the electrical resistivity below 70 K. (orig.)

Additional details

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
192
Journal Issue
4
Journal Page Range
p. 358-364.
ISSN
0921-4526
CODEN
PHYBE3