High εr and low loss microwave dielectric ceramics Ba3LiNb3−xTaxTi5O21
- 1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of New Processing Technology for Nonferrous Metal and Materials, Ministry of Education, College of Material Science and Engineering, Guilin University of Technology, Guilin 541004 (China)
Description
High dielectric constant and low loss microwave dielectric ceramics in the system Ba3LiNb3–xTaxTi5O21 (0 ≤ x ≤ 3) have been prepared through solid state ceramic route. The structure and microstructure of the compositions have been studied using powder X-ray diffraction and Scanning electron microscopic studies. The ceramics could be well densified under 1140 °C and exhibited a single hexagonal phase through the entire range of compositions. They show a linear variation of dielectric properties with the value of x. Their dielectric constant (εr) varies from 78 to 55.5, quality factor Q × f increases from 9780 to 18,480 GHz and temperature variation of resonant frequency reduces from +205 to +70 ppm °C−1 as the content of Ta increases. -- Highlights: ► The significant improvement in τf and Q × f are recognized with Ta substitution. ► The ceramics exhibits high εr of 78–55.5 and Q × f of 9780∼18,480 GHz ► The ceramics could be sintered at low temperatures from 1100 to 1160 °C.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2012.07.032Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2012.07.032;
- PII
- S0254-0584(12)00680-3;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 136
- Journal Issue
- 2-3
- Journal Page Range
- p. 599-603
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45020105
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIELECTRIC MATERIALS; MICROSTRUCTURE; PERMITTIVITY; SOLIDS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.