Published 2000
| Version v1
Miscellaneous
Open
Sensitivity of the PIXE method excited with He for studying oxides
Description
no abstract available
Availability note (English)
Available from INIS in electronic formFiles
35072372.pdf
Files
(18.4 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:ab7f8420ce6f306a2b1459b382634e8a
|
18.4 kB | Preview Download |
Additional details
Additional titles
- Original title (Spanish)
- Sensibilidad del metodo PIXE excitado con He para estudiar oxidos
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-MX--1425
Conference
- Title
- 43. National Physics Congress 2000
- Dates
- 30 Oct - 3 Nov 2000
- Place
- Puebla (Mexico)
INIS
- Country of Publication
- Mexico
- Country of Input or Organization
- Mexico
- INIS RN
- 35072372
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- HELIUM IONS; OXIDES; PIXE ANALYSIS; PROGRAMMING; PROTONS; SENSITIVITY; SPECTRA; TARGETS; TITANIUM
- Descriptors DEC
- BARYONS; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; IONS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEONS; OXYGEN COMPOUNDS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS