Nanoscale mechanical switching of ferroelectric polarization via flexoelectricity
- 1. Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States)
Description
Flexoelectric coefficient is a fourth-rank tensor arising from the coupling between strain gradient and electric polarization and thus exists in all crystals. It is generally ignored for macroscopic crystals due to its small magnitude. However, at the nanoscale, flexoelectric contributions may become significant and can potentially be utilized for device applications. Using the phase-field method, we study the mechanical switching of electric polarization in ferroelectric thin films by a strain gradient created via an atomic force microscope tip. Our simulation results show good agreement with existing experimental observations. We examine the competition between the piezoelectric and flexoelectric effects and provide an understanding of the role of flexoelectricity in the polarization switching. Also, by changing the pressure and film thickness, we reveal that the flexoelectric field at the film bottom can be used as a criterion to determine whether domain switching may happen under a mechanical force
Additional details
Identifiers
- DOI
- 10.1063/1.4905837;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 106
- Journal Issue
- 2
- Journal Page Range
- p. 022904-022904.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46104817
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; COMPUTERIZED SIMULATION; COUPLING; CRYSTALS; FERROELECTRIC MATERIALS; NANOSTRUCTURES; PIEZOELECTRICITY; POLARIZATION; POTENTIALS; STRAINS; TENSORS; THIN FILMS
- Descriptors DEC
- DIELECTRIC MATERIALS; ELECTRICITY; FILMS; MATERIALS; MICROSCOPY; SIMULATION
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC