Published October 2000
| Version v1
Miscellaneous
Development of a wave-dispersive-type x-ray detection system for PIXE
Creators
- 1. Musashi Institute of Technology, Tokyo (Japan)
- 2. Tokyo Inst. of Technology, Tokyo (Japan)
- 3. Ion Accelerator Corp., Hakodate, Hokkaido (Japan)
Description
We developed a wave-dispersive-type X-ray detection system to detect low energy X-ray and to obtain high energy resolution low energy X-ray for Particle Induced X-ray Emission (PIXE). A back irradiation type CCD and three types of crystal (RAP, PET and LiF) were used. The system was tested with an ultra small cyclotron and is scheduled to make experiments with the Van de Graaff accelerator of Tokyo Institute of Technology. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the third symposium on accelerator and related technology for application
- Imprint Pagination
- 121 p.
- Journal Page Range
- p. 85-88
Conference
- Title
- 3. symposium on accelerator and related technology for application
- Acronym
- ARTA 2000
- Dates
- 16-17 Oct 2000
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 41048374
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CHARGE-COUPLED DEVICES; CYCLOTRONS; DISPERSIONS; ENERGY RESOLUTION; ION BEAMS; IRRADIATION; PERFORMANCE TESTING; PIXE ANALYSIS; VAN DE GRAAFF ACCELERATORS; WAVELENGTHS; X-RAY DETECTION
- Descriptors DEC
- ACCELERATORS; BEAMS; CHEMICAL ANALYSIS; CYCLIC ACCELERATORS; DETECTION; ELECTROSTATIC ACCELERATORS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RESOLUTION; SEMICONDUCTOR DEVICES; TESTING; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 6 figs., 1 tab.