Published January 19, 2007 | Version v1
Journal article Metadata-only

A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer

Creators

  • 1. Synchrotron Soleil-Orme des Merisiers St Aubin BP48 -91192 Gif sur Yvette (France)
  • 2. Laboratoire Charles Fabry de l'Institut d'Optique, bat. 503, F91403 Orsay (France)
  • 3. Laboratoire de Photophysique Moleculaire, bat. 350, F91403 Orsay (France)

Description

A VUV Fourier transform spectrometer based on a wavefront division interferometer has been built. Our ultimate goal is to provide a high resolution absorption spectrometer in the 140 - 40 nm range using the new third generation French synchrotron source Soleil as the background continuum. Here, we present the design and latest performance of the instrument scanning control system. It is based on multiple reflections of a monomode, frequency-stabilized HeNe laser between two plane mirrors allowing the required sensitivity on the displacement of the interferometer mobile arm. The experimental results on the sampling precision show an rms error below 5 nm for a travel length of 7.5 mm

Additional details

Identifiers

DOI
10.1063/1.2436095;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
879
Journal Issue
1
Journal Page Range
p. 447-450
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international conference on synchrotron radiation instrumentation
Dates
28 May - 2 Jun 2006
Place
Daegu (Korea, Republic of)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39069375
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; CONTROL SYSTEMS; DESIGN; FAR ULTRAVIOLET RADIATION; FOURIER TRANSFORM SPECTROMETERS; HELIUM-NEON LASERS; LASER RADIATION; MIRRORS; PERFORMANCE; REFLECTION; RESOLUTION; SAMPLING; SENSITIVITY; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; GAS LASERS; LASERS; MEASURING INSTRUMENTS; RADIATION SOURCES; RADIATIONS; SPECTROMETERS; ULTRAVIOLET RADIATION

Optional Information

Notes
(c) 2007 American Institute of Physics