Published May 15, 2000 | Version v1
Journal article Metadata-only

Elemental mapping with an X-ray fluorescence imaging microscope

Creators

  • 1. Institute of Applied Physics, University of Tsukuba, 1-1-1, Tennoudai, Tsukuba, Ibaraki, 305-8573 (Japan)

Description

An X-ray fluorescence (XRF) imaging microscope with a Wolter-type grazing-incidence mirror as an objective was constructed at the beamline 39XU of SPring-8 (8 GeV, 70 mA) at Japan Synchrotron Radiation Institute. The monochromatic undulator X-rays in the energy range of 6-10 keV were used to produce XRF of a specimen. The microscope system was set normal to the incident beam to reduce elastic scattering from a specimen and to improve signal/background ratio. The two-dimensional elemental mappings of a test specimen (Cu, Ni, Fe wires) and inclusions (Fe, Co, Ni) in a synthesized diamond could be obtained by utilizing the absorption edges of the corresponding elements

Additional details

Identifiers

DOI
10.1063/1.1291154;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 259-262
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35069959
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; COBALT; COPPER; DIAMONDS; ELASTIC SCATTERING; GRAZING; IRON; KEV RANGE 01-10; MAPPING; MICROSCOPES; MICROSCOPY; NICKEL; SIGNAL-TO-NOISE RATIO; SYNCHROTRON RADIATION; WIRES; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
BREMSSTRAHLUNG; CARBON; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; FEEDING; IONIZING RADIATIONS; KEV RANGE; METALS; MINERALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; RADIATIONS; SCATTERING; SORPTION; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
(c) 2000 American Institute of Physics.