Published March 1, 2009
| Version v1
Journal article
Synthesis of SiC nanowires from gaseous SiO and pyrolyzed bamboo slices
Creators
- 1. School of Materials Science and Engineering, Shanxi University of Science and Technology, Xi'an 710021 (China)
Description
Bamboo slices have been pyrolyzed by heat treatment in an inert atmosphere at 1000 deg. C. The reaction of gaseous SiO and pyrolyzed bamboo slices at 1300 deg. C resulted in the formation of SiC nanowires. Microstructure characterization of the SiC nanowires was carried out by X-ray diffraction (XRD), transmission electron microscopy (TEM) and scanning electron microscopy (SEM). XRD analysis showed that the reaction product is crystalline β-SiC. The diameter and the length of the SiC nanowires is ranging from 20∼70nm to 10∼20μm. Most of the SiC nanowires possess straight and smooth morphology. SiC nanowires have a preferential growth axis parallel to the [111] direction.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/152/1/012072Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 152
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- MRS international materials research conference - Symposia D, E and F
- Dates
- 9-12 Jun 2008
- Place
- Chongqing (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41058169
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BAMBOO; HEAT TREATMENTS; QUANTUM WIRES; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; SILICON OXIDES; TEMPERATURE RANGE 1000-4000 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; GRAMINEAE; LILIOPSIDA; MAGNOLIOPHYTA; MICROSCOPY; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; PLANTS; SCATTERING; SILICON COMPOUNDS; TEMPERATURE RANGE