Published December 1998 | Version v1
Journal article

First multi-GeV particle-beam measurements using a synchroscan and dual-sweep x-ray streak camera

  • 1. Advanced Photon Source Argonne National Laboratory Argonne, Illinois 60439 (United States)

Description

Particle-beam characterizations of a multi-GeV storage ring beam have been done for the first time using a synchroscan and dual-sweep x-ray streak camera at the Advanced Photon Source (APS). The hard x-rays (2 - 20 keV) from a bending magnet source were imaged using an adjustable pinhole aperture. Both the horizontal size, σx∼190μm, and bunch length, σr∼28ps, were measured simultaneously. The Au photocathode provides sensitivity from 10 eV to 10 keV covering the three orders of magnitude in wavelength from the UV to hard x-rays. copyright 1998 American Institute of Physics

Additional details

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
451
Journal Issue
1
Journal Page Range
p. 214-221
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. beam instrumentation workshop (BIW-98)
Dates
4-7 May 1998
Place
Stanford, CA (United States)

Optional Information

Secondary number(s)
CONF-980573--