Published May 1, 2008 | Version v1
Journal article

Formation of gas atom encapsulated silicon clusters using electron beam generated silicon plasmas

  • 1. Department of Electronic Engineering, Tohoku University, Sendai 980-8579 (Japan)

Description

Nano-sized silicon (Si) clusters are formed using a Si plasma generated by an electron beam gun in the absence of an additional rare-gas plasma. In the case that an argon (Ar) plasma is superimposed on the Si plasma, on the other hand, not only the pure Si clusters but also Ar-doped Si clusters are found to be produced according to the analysis using a laser-desorption time-of-flight mass spectrometer. In addition, it is detected by an X-ray photoemission spectroscope that the doped Si clusters are mainly composed of Si and Ar. Based on these results, structure of the Si clusters is considered to be a spherical shape containing the Ar atom at the center of the Si cage. When a krypton (Kr) plasma is included in the Si plasma, however, it is revealed that Kr is difficult to be encapsulated into the Si clusters, which is attributed to its larger atomic-size compared with Ar

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2007.10.061

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.10.061;
PII
S0040-6090(07)01673-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
516
Journal Issue
13
Journal Page Range
p. 4374-4378
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
19. symposium on plasma science for materials
Acronym
SPSM-19
Dates
2-5 Jul 2006
Place
Cairns, QLD (Australia)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.