Formation of gas atom encapsulated silicon clusters using electron beam generated silicon plasmas
Creators
- 1. Department of Electronic Engineering, Tohoku University, Sendai 980-8579 (Japan)
Description
Nano-sized silicon (Si) clusters are formed using a Si plasma generated by an electron beam gun in the absence of an additional rare-gas plasma. In the case that an argon (Ar) plasma is superimposed on the Si plasma, on the other hand, not only the pure Si clusters but also Ar-doped Si clusters are found to be produced according to the analysis using a laser-desorption time-of-flight mass spectrometer. In addition, it is detected by an X-ray photoemission spectroscope that the doped Si clusters are mainly composed of Si and Ar. Based on these results, structure of the Si clusters is considered to be a spherical shape containing the Ar atom at the center of the Si cage. When a krypton (Kr) plasma is included in the Si plasma, however, it is revealed that Kr is difficult to be encapsulated into the Si clusters, which is attributed to its larger atomic-size compared with Ar
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2007.10.061Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2007.10.061;
- PII
- S0040-6090(07)01673-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 13
- Journal Page Range
- p. 4374-4378
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 19. symposium on plasma science for materials
- Acronym
- SPSM-19
- Dates
- 2-5 Jul 2006
- Place
- Cairns, QLD (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40002293
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; DOPED MATERIALS; ELECTRON BEAMS; KRYPTON; NANOSTRUCTURES; PHOTOEMISSION; PLASMA; SILICON; TIME-OF-FLIGHT MASS SPECTROMETERS; X RADIATION
- Descriptors DEC
- BEAMS; DYNAMIC MASS SPECTROMETERS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FLUIDS; GASES; IONIZING RADIATIONS; LEPTON BEAMS; MASS SPECTROMETERS; MATERIALS; MEASURING INSTRUMENTS; NONMETALS; PARTICLE BEAMS; RADIATIONS; RARE GASES; SECONDARY EMISSION; SEMIMETALS; SPECTROMETERS; TIME-OF-FLIGHT SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.