Published February 15, 2008 | Version v1
Journal article

Thermochromic properties of vanadium oxide films prepared by dc reactive magnetron sputtering

  • 1. Centro de Fisica e Departamento de Fisica, Universidade do Minho, 4710 Braga (Portugal)
  • 2. College of Physics, JiLin University, 2519 JieFangDaLu Road, 130021 ChangChun (China)
  • 3. Departamento de Fisica, Instituto Superior de Engenharia do Porto, Rua de Sao Tome, 4200 Porto (Portugal)
  • 4. Dept. Ciencia dos Materiais, CENIMAT, Faculdade de Ciencias e Tecnologia da Universidade Nova de Lisboa, PT-2829-516 Caparica (Portugal)

Description

A transparent vanadium oxide film has been one of the most studied electrochromic (EC) and Thermochromic (TC) materials. Vanadium oxide films were deposited at different substrate temperatures up to 400 deg. C and different ratios of the oxygen partial pressure (PO2). SEM, AFM and X-ray diffraction's results show detail structure data of the films. IR mode assignments of the films measured by IR reflection-absorbance in NGIA (near grazing incidence angle) are given. It is found that the film has V2O5 and VO2 combined structures. The films exhibit clear changes in transmittance when the environment temperature (Te) is varied, especially in the 3600-4000 cm-1 range. Applying a Te that is higher than a critical temperature (Tc) to the samples, the as-RT (room temperature) deposited film with 9% PO2 has a transmittance variation of 30%, but the films that were deposited on a heated substrate of 400 deg. C have little variation. There is tendency of bigger variation in transmittance for the sample deposited at a larger PO2, when it is applied by 200 deg. C Te

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2007.03.131

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.03.131;
PII
S0040-6090(07)00407-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
516
Journal Issue
7
Journal Page Range
p. 1484-1488
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium R on advances in transparent electronics - From materials to devices
Acronym
EMRS 2006
Dates
29 May - 2 Jun 2006
Place
Nice (France)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.