XOP: A graphical user interface for spectral calculations and x-ray optics utilities
Creators
- 1. Experimental Facilities Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
- 2. European Synchrotron Radiation Facility, BP 220, 38043 Grenoble-Cedex 9 (France)
Description
A graphical user interface, using the Interactive Data Language (IDL) widget toolkit, for calculation of spectral properties of synchrotron radiation sources and for interaction of x-rays with optical elements has been developed. The interface runs presently on three different computer architectures under the Unix operating system endash the Sun-OS, the HP-UX, and the DEC-Unix operating systems. The point-and-click interface is used as a driver program for a variety of codes from different authors written in different computer languages. The execution of codes for calculating synchrotron radiation from undulators, wigglers, and bending magnets is summarized. The computation of optical properties of materials and the x-ray diffraction profiles from crystals in different geometries are also discussed. The interface largely simplifies the use of these codes and may be used without prior knowledge of how to run a particular program. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 67
- Journal Issue
- 9
- Journal Page Range
- p. 3356.
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
- Acronym
- SRI '95
- Dates
- 16-20 Oct 1995.
- Place
- Argonne, IL (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28013874
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANL; COMPUTER CODES; EQUIPMENT INTERFACES; MATERIALS; OPTICAL PROPERTIES; OPTICAL SYSTEMS; SPECTRA; SYNCHROTRON RADIATION SOURCES; X-RAY EQUIPMENT
- Descriptors DEC
- EQUIPMENT; NATIONAL ORGANIZATIONS; PHYSICAL PROPERTIES; RADIATION SOURCES; US AEC; US DOE; US ERDA; US ORGANIZATIONS
Optional Information
- Secondary number(s)
- CONF-9510119--.