Published September 1996 | Version v1
Journal article

XOP: A graphical user interface for spectral calculations and x-ray optics utilities

  • 1. Experimental Facilities Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
  • 2. European Synchrotron Radiation Facility, BP 220, 38043 Grenoble-Cedex 9 (France)

Description

A graphical user interface, using the Interactive Data Language (IDL) widget toolkit, for calculation of spectral properties of synchrotron radiation sources and for interaction of x-rays with optical elements has been developed. The interface runs presently on three different computer architectures under the Unix operating system endash the Sun-OS, the HP-UX, and the DEC-Unix operating systems. The point-and-click interface is used as a driver program for a variety of codes from different authors written in different computer languages. The execution of codes for calculating synchrotron radiation from undulators, wigglers, and bending magnets is summarized. The computation of optical properties of materials and the x-ray diffraction profiles from crystals in different geometries are also discussed. The interface largely simplifies the use of these codes and may be used without prior knowledge of how to run a particular program. copyright 1996 American Institute of Physics

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
67
Journal Issue
9
Journal Page Range
p. 3356.
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
Acronym
SRI '95
Dates
16-20 Oct 1995.
Place
Argonne, IL (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28013874
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANL; COMPUTER CODES; EQUIPMENT INTERFACES; MATERIALS; OPTICAL PROPERTIES; OPTICAL SYSTEMS; SPECTRA; SYNCHROTRON RADIATION SOURCES; X-RAY EQUIPMENT
Descriptors DEC
EQUIPMENT; NATIONAL ORGANIZATIONS; PHYSICAL PROPERTIES; RADIATION SOURCES; US AEC; US DOE; US ERDA; US ORGANIZATIONS

Optional Information

Secondary number(s)
CONF-9510119--.